LEAD- Brookhaven Low Energy Accelerator Development Facility
The Accelerator Facilities Division (AFD) at Brookhaven National Laboratory, is deploying the Low Energy Accelerator Development (LEAD) Facility which offers access to an MeV-class Ultrafast Electron Diffraction (UED) device and two radiation-shielded accelerator development and test bunkers offering 1,648 and 833 sq. ft. of research space, respectively, with a dedicated controls area to enable a broad range research and development activities with external partners and users.
Since its inception in 2010, BNL UED has enabled users to study ultrafast dynamics of materials such as thermoelectrics, superionics, and phase-changing metamaterials. A new beamline extension, consisting of a new sample chamber, detectors, and a spectrometer, will enhance the facility’s flexibility, enabling the study of new types of materials and single-event effects in electronics.
Facility bio
Name of Facility: Low Energy Accelerator Development Facility (LEAD)
Laboratory: Brookhaven National Laboratory
Address: PO Box 5000, Upton, NY, 11973 USA
Point of Contact: William Li
Publications list: Link (Note: UED publications are listed alongside ATF publications on a common web-page)
| Parameter | Value |
|---|---|
| Beam Type | Electrons |
| Beam Energy | 3 MeV |
| Repetition Rate | 1 - 48 Hz |
| Bunch Charge | 20 - 200 fC |
| Temporal resolution | 200 fs |
| Beam spot size | 100 μm (with collimator) to millimeters |
Capabilities
Science specialists: Mikhail Fedurin (electron beam dynamics and diagnostics), Marcus Babzien (laser systems), William Li (electron beam dynamics and diagnostics), Karl Kusche (vacuum systems)
Available tools: Vsystem-based control system, Ce:YAG screens, Andor sCMOS camera, multi-sample sample holder, electron beam collimators, Faraday cup, RF deflector
Ideal Experiment
BNL UED is well suited for experiments that require low beam energy and high temporal resolution. The archetypal example of such an experiment is the study of molecular phase transitions using a laser pump and an ultrafast electron probe. The new beamline extension will allow for rapid sample changeout, enabling experiments, such as single-event effect testing, which expect to test many samples in a single experimental run. Differential pumping in the new extension permits the study of samples that may outgas too much for facilities requiring ultra-high vacuum conditions.
